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"A New March Test for Process-Variation Induced Delay Faults in SRAMs."

Da Cheng et al. (2013)

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DOI: 10.1109/ATS.2013.31

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-22

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  dblp key:
  - conf/ats/ChengH0CZGG13
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  persistent URL:
  - https://dblp.org/rec/conf/ats/ChengH0CZGG13
Da Cheng, Hsunwei Hsiung, Bin Liu, Jianing Chen, Jia Zeng, Ramesh Govindan, Sandeep K. Gupta:
A New March Test for Process-Variation Induced Delay Faults in SRAMs. Asian Test Symposium 2013: 115-122

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