"Testing approach within FPGA-based fault tolerant systems."

Abderrahim Doumar, Hideo Ito (2000)

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DOI: 10.1109/ATS.2000.893658

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Abderrahim Doumar, Hideo Ito:
Testing approach within FPGA-based fault tolerant systems. Asian Test Symposium 2000: 411-416

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