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"ATREX : Design for Testability System for Mega Gate LSIs."
Michiaki Emori et al. (1997)
- Michiaki Emori, Junko Kumagai, Koichi Itaya, Takashi Aikyo, Tomoko Anan, Junichi Niimi:
ATREX : Design for Testability System for Mega Gate LSIs. Asian Test Symposium 1997: 126-
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