"Reduced-Complexity Transition-Fault Test Generation for Non-scan Circuits ..."

Valerio Guarnieri, Franco Fummi, Krishnendu Chakrabarty (2012)

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DOI: 10.1109/ATS.2012.47

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Valerio Guarnieri, Franco Fummi, Krishnendu Chakrabarty:
Reduced-Complexity Transition-Fault Test Generation for Non-scan Circuits through High-Level Mutant Injection. Asian Test Symposium 2012: 302-307

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