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"On Improving a Fault Simulation Based Test Generator for Synchronous ..."

Ruifeng Guo, Sudhakar M. Reddy, Irith Pomeranz (2001)

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DOI: 10.1109/ATS.2001.990264

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Ruifeng Guo, Sudhakar M. Reddy, Irith Pomeranz:
On Improving a Fault Simulation Based Test Generator for Synchronous Sequential Circuits. Asian Test Symposium 2001: 82-

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