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"On Test and Characterization of Analog Linear Time-Invariant Circuits ..."

Zhen Guo et al. (2001)

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DOI: 10.1109/ATS.2001.990306

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
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  - https://dblp.org/rec/conf/ats/GuoZSS01
Zhen Guo, Xi Min Zhang, Jacob Savir, Yun-Qing Shi:
On Test and Characterization of Analog Linear Time-Invariant Circuits Using Neural Networks. Asian Test Symposium 2001: 338-343

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