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"On Test and Characterization of Analog Linear Time-Invariant Circuits ..."
Zhen Guo et al. (2001)
- Zhen Guo, Xi Min Zhang, Jacob Savir, Yun-Qing Shi:
On Test and Characterization of Analog Linear Time-Invariant Circuits Using Neural Networks. Asian Test Symposium 2001: 338-343
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