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"Yield Improvement and Test Cost Optimization for 3D Stacked ICs."
Said Hamdioui, Mottaqiallah Taouil (2011)
- Said Hamdioui, Mottaqiallah Taouil:
Yield Improvement and Test Cost Optimization for 3D Stacked ICs. Asian Test Symposium 2011: 480-485
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