"Techniques for Finding Xs in Test Sequences for Sequential Circuits and ..."

Yoshinobu Higami et al. (2004)

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DOI: 10.1109/ATS.2004.80

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Yoshinobu Higami, Seiji Kajihara, Shin-ya Kobayashi, Yuzo Takamatsu:
Techniques for Finding Xs in Test Sequences for Sequential Circuits and Applications to Test Length/Power Reduction. Asian Test Symposium 2004: 46-49

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