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"On Compact Test Sets for Multiple Stuck-at Faults for Large Circuits."
Seiji Kajihara, Atsushi Murakami, Tomohisa Kaneko (1999)
- Seiji Kajihara, Atsushi Murakami, Tomohisa Kaneko:
On Compact Test Sets for Multiple Stuck-at Faults for Large Circuits. Asian Test Symposium 1999: 20-24
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