"Defect Coverage-Driven Window-Based Test Compression."

Xrysovalantis Kavousianos et al. (2010)

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DOI: 10.1109/ATS.2010.33

access: closed

type: Conference or Workshop Paper

metadata version: 2024-08-04

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Xrysovalantis Kavousianos, Krishnendu Chakrabarty, Emmanouil Kalligeros, Vasileios Tenentes:
Defect Coverage-Driven Window-Based Test Compression. Asian Test Symposium 2010: 141-146

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