"Algorithmic Test Generation for Supply Current Testing of TTL ..."

Toshimasa Kuchii, Masaki Hashizume, Takeomi Tamesada (1996)

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DOI: 10.1109/ATS.1996.555155

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Toshimasa Kuchii, Masaki Hashizume, Takeomi Tamesada:
Algorithmic Test Generation for Supply Current Testing of TTL Combinational Circuits. Asian Test Symposium 1996: 171-176

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