"Peak-power reduction for multiple-scan circuits during test application."

Kuen-Jong Lee, Tsung-Chu Huang, Jih-Jeen Chen (2000)

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DOI: 10.1109/ATS.2000.893666

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Kuen-Jong Lee, Tsung-Chu Huang, Jih-Jeen Chen:
Peak-power reduction for multiple-scan circuits during test application. Asian Test Symposium 2000: 453-458

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