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"A Multi-dimensional Pattern Run-Length Method for Test Data Compression."

Lung-Jen Lee et al. (2009)

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DOI: 10.1109/ATS.2009.49

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/ats/LeeTLL09
Lung-Jen Lee, Wang-Dauh Tseng, Rung-Bin Lin, Chen-Lun Lee:
A Multi-dimensional Pattern Run-Length Method for Test Data Compression. Asian Test Symposium 2009: 325-330

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