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"On Modeling CMOS Library Cells for Cell Internal Fault Test Pattern ..."

Xijiang Lin et al. (2021)

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DOI: 10.1109/ATS52891.2021.00030

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-17

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Xijiang Lin, Wu-Tung Cheng, Takeo Kobayashi, Andreas Glowatz:
On Modeling CMOS Library Cells for Cell Internal Fault Test Pattern Generation. ATS 2021: 103-108

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