"LBIST/ATPG Technologies for On-Demand Digital Logic Testing in Automotive ..."

Dale Meehl, Bassilios Petrakis, Ping Zhang (2012)

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DOI: 10.1109/ATS.2012.24

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Dale Meehl, Bassilios Petrakis, Ping Zhang:
LBIST/ATPG Technologies for On-Demand Digital Logic Testing in Automotive Circuits. Asian Test Symposium 2012: 2

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