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"CMOS Floating Gate Defect Detection Using I DDQ Test with DC Power Supply."
Hiroyuki Michinishi et al. (2002)
- Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo:
CMOS Floating Gate Defect Detection Using I DDQ Test with DC Power Supply. Asian Test Symposium 2002: 417-422
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