"Improvement of Detectability for CMOS Floating Gate Defects in Supply ..."

Hiroyuki Michinishi et al. (2003)

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DOI: 10.1109/ATS.2003.1250846

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo:
Improvement of Detectability for CMOS Floating Gate Defects in Supply Current Test. Asian Test Symposium 2003: 406-411

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