"Optimal Scan Tree Construction with Test Vector Modification for Test ..."

Kohei Miyase, Seiji Kajihara (2003)

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DOI: 10.1109/ATS.2003.1250798

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Kohei Miyase, Seiji Kajihara:
Optimal Scan Tree Construction with Test Vector Modification for Test Compression. Asian Test Symposium 2003: 136-141

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