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"Test Generation for Multiple-Threshold Gate-Delay Fault Model."

Michinobu Nakao et al. (2001)

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DOI: 10.1109/ATS.2001.990290

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Michinobu Nakao, Yoshikazu Kiyoshige, Kazumi Hatayama, Yasuo Sato, Takaharu Nagumo:
Test Generation for Multiple-Threshold Gate-Delay Fault Model. Asian Test Symposium 2001: 244-

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