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"Low Power BIST for Scan-Shift and Capture Power."
Yasuo Sato et al. (2012)
- Yasuo Sato, Senling Wang, Takaaki Kato, Kohei Miyase, Seiji Kajihara:
Low Power BIST for Scan-Shift and Capture Power. Asian Test Symposium 2012: 173-178
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