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"Diagnosis of Single Gate Delay Faults in Combinational Circuits using ..."
Hiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu (1998)
- Hiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu:
Diagnosis of Single Gate Delay Faults in Combinational Circuits using Delay Fault Simulation. Asian Test Symposium 1998: 108-112
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