"A Fault Partitioning Method in Parallel Test Generation for Large Scale ..."

Zhide Zeng, Jihua Chen, Pengxia Liu (1999)

> Home

Details and statistics

DOI: 10.1109/ATS.1999.810741

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/ats/ZengCL99
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ats/ZengCL99
Zhide Zeng, Jihua Chen, Pengxia Liu:
A Fault Partitioning Method in Parallel Test Generation for Large Scale VLSI Circuits. Asian Test Symposium 1999: 133-

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.