"Improving the scan rate and image quality in tapping Mode Atomic Force ..."

Matthew W. Fairbairn, S. O. Reza Moheimani, Andrew J. Fleming (2011)

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type: Conference or Workshop Paper

metadata version: 2021-08-08

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Matthew W. Fairbairn, S. O. Reza Moheimani, Andrew J. Fleming:
Improving the scan rate and image quality in tapping Mode Atomic Force Microscopy with piezoelectric shunt control. AuCC 2011: 26-31

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