"Automatic Device Identification and Anomaly Detection with Machine ..."

Chin-Wei Tien et al. (2020)

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DOI: 10.1109/BIGDATA50022.2020.9378168

access: closed

type: Conference or Workshop Paper

metadata version: 2021-04-08

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Chin-Wei Tien, Tse-Yung Huang, Ping Chun Chen, Jenq-Haur Wang:
Automatic Device Identification and Anomaly Detection with Machine Learning Techniques in Smart Factories. IEEE BigData 2020: 3539-3544

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