"SEM Image Analysis for Quality Control of Nanoparticles."

Simon K. Alexander et al. (2009)

Details and statistics

DOI: 10.1007/978-3-642-03767-2_72

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-07

a service of  Schloss Dagstuhl - Leibniz Center for Informatics