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"Automated four-point probe measurement of nanowires inside a scanning ..."

Changhai Ru et al. (2010)

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DOI: 10.1109/COASE.2010.5584461

access: closed

type: Conference or Workshop Paper

metadata version: 2021-07-07

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Changhai Ru, Yong Zhang, Yu Sun, Yu Zhong, Xueliang Sun, David Hoyle, Ian Cotton:
Automated four-point probe measurement of nanowires inside a scanning electron microscope. CASE 2010: 533-538

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