"Breaking Integrated Circuit Device Security through Test Mode Silicon ..."

Markus Kammerstetter et al. (2014)

> Home

Details and statistics

DOI: 10.1145/2660267.2660301

access: closed

type: Conference or Workshop Paper

metadata version: 2020-11-10

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/ccs/KammerstetterMBPK14
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ccs/KammerstetterMBPK14
Markus Kammerstetter, Markus Muellner, Daniel Burian, Christian Platzer, Wolfgang Kastner:
Breaking Integrated Circuit Device Security through Test Mode Silicon Reverse Engineering. CCS 2014: 549-557

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.