"Memory Safety for Embedded Devices with nesCheck."

Daniele Midi, Mathias Payer, Elisa Bertino (2017)

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DOI: 10.1145/3052973.3053014

access: closed

type: Conference or Workshop Paper

metadata version: 2025-01-19

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Daniele Midi, Mathias Payer, Elisa Bertino:
Memory Safety for Embedded Devices with nesCheck. AsiaCCS 2017: 127-139

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