"The Dual Model for Everyday Stress Technology: Understanding the Lived ..."

Sigrid Hoddø Bakås et al. (2025)

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DOI: 10.1145/3706598.3713174

access: closed

type: Conference or Workshop Paper

metadata version: 2025-05-09

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Sigrid Hoddø Bakås, Mikolaj P. Wozniak, Jo Herstad, Pawel W. Wozniak, Jasmin Niess:
The Dual Model for Everyday Stress Technology: Understanding the Lived Experience of Data-Driven Stress. CHI 2025: 717:1-717:18

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