"Characterization of SRAM sense amplifier input offset for yield prediction ..."

Mohamed H. Abu-Rahma et al. (2011)

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DOI: 10.1109/CICC.2011.6055315

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-26

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Mohamed H. Abu-Rahma, Ying Chen, Wing Sy, Wee Ling Ong, Leon Yeow Ting, Sei Seung Yoon, Michael Han, Esin Terzioglu:
Characterization of SRAM sense amplifier input offset for yield prediction in 28nm CMOS. CICC 2011: 1-4

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