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"A yield and speed enhancement scheme under within-die variations on 90nm ..."

Kazuya Katsuki et al. (2005)

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DOI: 10.1109/CICC.2005.1568739

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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Kazuya Katsuki, Manabu Kotani, Kazutoshi Kobayashi, Hidetoshi Onodera:
A yield and speed enhancement scheme under within-die variations on 90nm LUT array. CICC 2005: 601-604

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