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"An SRAM reliability test macro for fully-automated statistical ..."

Tony Tae-Hyoung Kim, Wei Zhang, Chris H. Kim (2009)

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DOI: 10.1109/CICC.2009.5280846

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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Tony Tae-Hyoung Kim, Wei Zhang, Chris H. Kim:
An SRAM reliability test macro for fully-automated statistical measurements of Vmin degradation. CICC 2009: 231-234

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