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"A 640 pW 22 pJ/sample Gate Leakage-Based Digital CMOS Temperature Sensor ..."

Daniel S. Truesdell, Benton H. Calhoun (2019)

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DOI: 10.1109/CICC.2019.8780382

access: closed

type: Conference or Workshop Paper

metadata version: 2019-10-19

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Daniel S. Truesdell, Benton H. Calhoun:
A 640 pW 22 pJ/sample Gate Leakage-Based Digital CMOS Temperature Sensor with 0.25°C Resolution. CICC 2019: 1-4

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