"28nm metal-gate high-K CMOS SoC technology for high-performance mobile ..."

S. H. Yang et al. (2011)

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DOI: 10.1109/CICC.2011.6055355

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type: Conference or Workshop Paper

metadata version: 2023-10-06

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S. H. Yang, J. Y. Sheu, M. K. Ieong, M. H. Chiang, T. Yamamoto, J. J. Liaw, S. S. Chang, Y. M. Lin, T. L. Hsu, J. R. Hwang, J. K. Ting, C. H. Wu, K. C. Ting, F. C. Yang, C. M. Liu, I. L. Wu, Y. M. Chen, S. J. Chent, K. S. Chen, J. Y. Cheng, M. H. Tsai, W. Chang, R. Chen, C. C. Chen, T. L. Lee, C. K. Lin, S. C. Yang, Y. M. Sheu, J. T. Tzeng, L. C. Lu, S. M. Jang, Carlos H. Diaz, Yuh-Jier Mii:
28nm metal-gate high-K CMOS SoC technology for high-performance mobile applications. CICC 2011: 1-5

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