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"Predicting company failure-a comparison between neural networks and ..."
R. J. Van Eyden, P. W. C. De Wit, J. C. Arron (1995)
- R. J. Van Eyden, P. W. C. De Wit, J. C. Arron:
Predicting company failure-a comparison between neural networks and established statistical techniques by applying the McNemar test. CIFEr 1995: 91-96
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