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"Fault Coverage Enhancement via Weighted Random Pattern Generation in BIST ..."

Hillol Maity et al. (2019)

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DOI: 10.1109/ICIT48102.2019.00047

access: closed

type: Conference or Workshop Paper

metadata version: 2020-03-26

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  dblp key:
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Hillol Maity, Kaushik Khatua, Santanu Chattopadhyay, Indranil Sengupta, Girish Patankar, Parthajit Bhattacharya:
Fault Coverage Enhancement via Weighted Random Pattern Generation in BIST Using a DNN-Driven-PSO Approach. ICIT 2019: 228-233

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