"Deterministic Identity Testing Paradigms for Bounded Top-Fanin Depth-4 ..."

Pranjal Dutta, Prateek Dwivedi, Nitin Saxena (2021)

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DOI: 10.4230/LIPICS.CCC.2021.11

access: open

type: Conference or Workshop Paper

metadata version: 2023-12-07

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Pranjal Dutta, Prateek Dwivedi, Nitin Saxena:
Deterministic Identity Testing Paradigms for Bounded Top-Fanin Depth-4 Circuits. CCC 2021: 11:1-11:27

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