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"Defective Wafer Detection Using Sensed Numerical Features."

Kotcharat Kitchat, Ching-Yu Lin, Min-Te Sun (2021)

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DOI: 10.1109/COINS51742.2021.9524156

access: closed

type: Conference or Workshop Paper

metadata version: 2021-09-09

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  dblp key:
  - conf/coins/KitchatLS21
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  - https://dblp.org/rec/conf/coins/KitchatLS21
Kotcharat Kitchat, Ching-Yu Lin, Min-Te Sun:
Defective Wafer Detection Using Sensed Numerical Features. COINS 2021: 1-6

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