"Gate-level process variation offset technique by using dual voltage ..."

Benjamin Stefan Devlin, Makoto Ikeda, Kunihiro Asada (2012)

Details and statistics

DOI: 10.1109/COOLCHIPS.2012.6216585

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

a service of  Schloss Dagstuhl - Leibniz Center for Informatics