"A Method for Logic Circuit Test Generation Based on Boolean Partial ..."

Changqian Wang, Chenghua Wang (2009)

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DOI: 10.1109/CSIE.2009.44

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Changqian Wang, Chenghua Wang:
A Method for Logic Circuit Test Generation Based on Boolean Partial Derivative and BDD. CSIE (3) 2009: 499-504

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