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"Analysis of Si and GaN GAA-NW-FETs in High-k Gate Oxides for Next ..."
- Ygor Fonseca, Rafael Nóbrega, Ulysses Duarte, Thiago R. Raddo, Iyad Dayoub

, Anderson L. Sanches
, Murilo Bellezoni Loiola:
Analysis of Si and GaN GAA-NW-FETs in High-k Gate Oxides for Next Generation Mobile Systems. CSNDSP 2020: 1-5

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