"The Main Damage Characteristics of Semiconductor Devices Under High-Power ..."

Kaibai Chen (2018)

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DOI: 10.1007/978-981-13-6508-9_67

access: closed

type: Conference or Workshop Paper

metadata version: 2020-04-13

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Kaibai Chen:
The Main Damage Characteristics of Semiconductor Devices Under High-Power Microwave. CSPS (3) 2018: 558-563

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