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"A Fast and Low Cost Testing Technique for Core-Based System-on-Chip."

Indradeep Ghosh, Sujit Dey, Niraj K. Jha (1998)

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DOI: 10.1145/277044.277190

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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  dblp key:
  - conf/dac/GhoshDJ98
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Indradeep Ghosh, Sujit Dey, Niraj K. Jha:
A Fast and Low Cost Testing Technique for Core-Based System-on-Chip. DAC 1998: 542-547

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