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"On the Design of Reliable 3D-ICs Considering Charged Device Model ESD ..."

Duckhwan Kim, Saibal Mukhopadhyay (2014)

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DOI: 10.1145/2593069.2593168

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Duckhwan Kim, Saibal Mukhopadhyay:
On the Design of Reliable 3D-ICs Considering Charged Device Model ESD Events During Die Stacking. DAC 2014: 27:1-27:6

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