"DRIS-3: Deep Neural Network Reliability Improvement Scheme in 3D ..."

Jae-San Kim, Joon-Sung Yang (2019)

> Home

Details and statistics

DOI: 10.1145/3316781.3317805

access: closed

type: Conference or Workshop Paper

metadata version: 2021-08-08

- view
  authority control:
- export record
  dblp key:
  - conf/dac/KimY19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/dac/KimY19
Jae-San Kim, Joon-Sung Yang:
DRIS-3: Deep Neural Network Reliability Improvement Scheme in 3D Die-Stacked Memory based on Fault Analysis. DAC 2019: 129

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.