"Probabilistic bug-masking analysis for post-silicon tests in ..."

Doowon Lee et al. (2016)

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DOI: 10.1145/2897937.2898072

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Doowon Lee, Tom Kolan, Arkadiy Morgenshtein, Vitali Sokhin, Ronny Morad, Avi Ziv, Valeria Bertacco:
Probabilistic bug-masking analysis for post-silicon tests in microprocessor verification. DAC 2016: 24:1-24:6

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