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"Sneak-Path Based Test and Diagnosis for 1R RRAM Crossbar Using Voltage ..."

Tianjian Li et al. (2017)

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DOI: 10.1145/3061639.3062318

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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  dblp key:
  - conf/dac/LiBJLJ17
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  - https://dblp.org/rec/conf/dac/LiBJLJ17
Tianjian Li, Xiangyu Bi, Naifeng Jing, Xiaoyao Liang, Li Jiang:
Sneak-Path Based Test and Diagnosis for 1R RRAM Crossbar Using Voltage Bias Technique. DAC 2017: 38:1-38:6

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