"Quick detection of difficult bugs for effective post-silicon validation."

David Lin et al. (2012)

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DOI: 10.1145/2228360.2228461

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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David Lin, Ted Hong, Farzan Fallah, Nagib Hakim, Subhasish Mitra:
Quick detection of difficult bugs for effective post-silicon validation. DAC 2012: 561-566

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