"Extreme Delay Sensitivity and the Worst-Case Switching Activity in VLSI ..."

Farid N. Najm, Michael Y. Zhang (1995)

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DOI: 10.1145/217474.217600

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Farid N. Najm, Michael Y. Zhang:
Extreme Delay Sensitivity and the Worst-Case Switching Activity in VLSI Circuits. DAC 1995: 623-627

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