"Efficient smart sampling based full-chip leakage analysis for intra-die ..."

Vineeth Veetil et al. (2009)

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DOI: 10.1145/1629911.1629956

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Vineeth Veetil, Dennis Sylvester, David T. Blaauw, Saumil Shah, Steffen Rochel:
Efficient smart sampling based full-chip leakage analysis for intra-die variation considering state dependence. DAC 2009: 154-159

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